Вид документа : Статья из журнала Шифр издания : 54/C 47 Автор(ы) : Ananyev M. V., Bronin D. I., Osinkin D. A., Eremin V. A., Steinberger-Wilckens R., De Haart L. G. J., Mertens J. Заглавие : Characterization of Ni-cermet degradation phenomena I. Long term resistivity monitoring, image processing and X-ray fluorescence analysis Цена : Б.ц. ББК : 54 Предметные рубрики: ХИМИЧЕСКИЕ НАУКИ Ключевые слова (''Своб.индексиров.''): пористость--удельное сопротивление--оксид иттрия--оксид циркония Аннотация: The present paper is devoted to Ni-cermet degradation phenomena and places emphasis on experimental approaches and data handling. The resistivity of Ni-YSZ cermet (nickel and 8 mol.% yttria stabilized zirconia) anode substrates was monitored during 3000 h at 700 and 800 °C in a gas mixture of 80 vol.% water vapor and 20 vol.% hydrogen. The experimentally evaluated dependence of resistivity of the Ni-YSZ substrates can be well described by exponential decay functions. Post test analysis by image processing and XRF (X-ray fluorescence) analysis for characterization of the microstructure and elemental composition were carried out for virgin samples and after 300, 1000 and 3000 h of exposure time. The 3D-microstructure was reconstructed using an original spheres packing algorithm. Two processes leading to the Ni-YSZ degradation were observed: Ni-phase particle coarsening and volatilization. The effect of these processes on resistivity and such microstructure parameters as porosity, Ni-phase fraction, Ni and YSZ phases particle size distributions, triple phase boundary length, and tortuosity factor are considered in this paper. Доп.точки доступа: Ananyev , M. V.; Bronin, D. I.; Бронин Дмитрий Игоревич; Osinkin, D. A.; Eremin, V. A.; Steinberger-Wilckens, R.; De Haart, L. G. J.; Mertens , J.